Contrast mechanism for visualization of ferroelectric domains with scanning force microscopy

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 954-955

  Jungk, T ^a   Hoffmann, A ^a   Soergel, E ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549107052     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760808834X     Document Type: Conference Paper

References (6)

1. A. Gruverman et al., J. Materials Science 41 (2006) 107.
2. T. Jungk et al., New J. Phys. 10 (2008) 013019.
3. E. Soergel, Appl. Phys. B 81 (2005) 729.
4. M. Abplanalp et al., Appl. Phys.A 66 (1998) S231.
5. T. Jungk et al., Appl. Phys. Lett. 89 (2006) 163507.
6. This research was supported by the Deutsche Telekom AG.