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Volumn 51, Issue , 2008, Pages 376-378
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A 153Mb-SRAM design will dynamic stability enhancement and leakage reduction in 45nm high-κ metal-gate CMOS technology
a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
LOGIC DESIGN;
STATIC RANDOM ACCESS STORAGE;
ACTIVE FEEDBACK CONTROL;
BUILDING BLOCKES;
CMOS TECHNOLOGY;
FORWARD BODY BIAS;
LEAKAGE REDUCTION;
PVT VARIATIONS;
STABILITY ENHANCEMENT;
VOLTAGE GENERATORS;
INTEGRATED CIRCUIT DESIGN;
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EID: 49549092261
PISSN: 01936530
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISSCC.2008.4523214 Document Type: Conference Paper |
Times cited : (39)
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References (6)
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