Characterization of nanocomposite materials using electron microscopy

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 300-301

  Rangari, V K ^a   Shaik, M Y ^a   Jeelani, S ^a  

^a TUSKEGEE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549091332     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086303     Document Type: Conference Paper

References (0)