Beam-induced changes of FePt nanoparticles during STEM in-situ annealing

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 348-349

  Wittig, J E ^a   Bentley, J ^b   Allard, L F ^b   Wellons, M S ^c   Lukehart, C M ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549085260     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608087527     Document Type: Conference Paper

References (6)

1. S. Sun et al., Science 287 (2000) 1989-92.
2. H. Zeng et al., Appl. Phys. Lett. 80 (2002) 2583-5.
3. J.E. Wittig et al., Microsc. Microanal. 13(Suppl.2) (2007) 1196-7.
4. J.E. Wittig et al., these proceedings (2008).
5. L.F. Allard et al., these proceedings (2008).
6. Research at the Oak Ridge National Laboratory SHaRE User Facility was supported by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy, under Contract DE-AC05-00OR22725 with UT-Battelle, LLC.