Electrical properties of nanometre thin film polystyrene for organic electronic applications

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 15, Issue 4, 2008, Pages 905-909

  Prime, D ^a   Paul, S ^a   Josephs Franks, P W ^b  

^a DE MONTFORT UNIVERSITY   (United Kingdom)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Charge density; Dielectric; Nanometer film; Organic electronics; Polystyrene; Thin film

Indexed keywords

ANNEALING; ELECTRIC PROPERTIES; THERMOELECTRIC EQUIPMENT; THICK FILMS; THICKNESS MEASUREMENT; THIN FILMS; VAPOR DEPOSITION;

ANNEALING TEMPERATURES; CAPACITANCE-VOLTAGE CHARACTERISTICS; CHARGE DENSITY; CURRENT-VOLTAGE BEHAVIORS; DIELECTRIC; ELECTRICAL CHARACTERISTICS; ELECTRICAL PROPERTIES; ELECTRONIC APPLICATIONS; ELECTRONIC DEVICES; MECHANICAL CHARACTERISTICS; NANOMETER FILM; NANOMETRE; NANOMETRE RANGE; ORGANIC ELECTRONIC DEVICES; ORGANIC ELECTRONICS; ORGANIC INSULATORS; POLYSTYRENE; POLYSTYRENE FILMS; THIN FILM;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 49449091640     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2008.4591208     Document Type: Article

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