Ultrasonically driven nanomechanical single-electron shuttle

Nature Nanotechnology

Volumn 3, Issue 8, 2008, Pages 482-485

  Koenig, Daniel R ^a   Weig, Eva M ^a   Kotthaus, Jorg P ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRONS; FIELD EFFECT TRANSISTORS;

DEVICE PERFORMANCE; ELECTRICAL CURRENT; EXCITATION MECHANISMS; FUNDAMENTAL PHYSICAL CONSTANT; HIGH PERFORMANCE DEVICES; LOW TEMPERATURES; MECHANICAL DEVICE; SINGLE-ELECTRON PUMP;

SINGLE ELECTRON TRANSISTORS;

ARTICLE; DEVICE; FINITE ELEMENT ANALYSIS; LOW TEMPERATURE; MOLECULAR MECHANICS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; ULTRASOUND;

EID: 49449087476     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2008.178     Document Type: Article

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