Bayesian checking of the second levels of hierarchical models

Statistical Science

Volumn 22, Issue 3, 2007, Pages 322-343

  Bayarri, M J ^a   Castellanos, M E ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSIDAD REY JUAN CARLOS   (Spain)

Author keywords

Conflict; Empirical Bayes; Model checking; Model criticism; Objective Bayesian methods; p values; Partial posterior predictive; Posterior predictive

Indexed keywords

EID: 49449083133     PISSN: 08834237     EISSN: None     Source Type: Journal    
DOI: 10.1214/07-STS235     Document Type: Article

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