SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 75, Issue 8, 2004, Pages 2625-2630

Test facility for simultaneous measurement of electrical and thermal contact resistance

(2) Misra, Prashant a Nagaraju, J a

a INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DIFFUSION; ELECTRIC CONDUCTANCE; ELECTRIC CONTACTS; HARDNESS; HEAT LOSSES; HYDRAULICS; MATHEMATICAL MODELS; SERVOMECHANISMS; THERMAL EFFECTS;

DIGITAL MULTIMETERS (DMM); ELECTRICAL CONTACT RESISTANCE (ECR); HEAT FLUX METERS (HFM); HEATER-COOLER BLOCKS (HCB); OXYGEN-FREE HIGH-CONDUCTIVITY (OFHC); THERMAL CONTACT CONDUCTANCE (TCC); THERMAL CONTACT RESISTANCE (TCR);

ELECTRIC RESISTANCE;

EID: 4944267024 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1775316 Document Type: Article

Times cited : (19)

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2
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3
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4
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5
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6
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7
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8
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- M. M. Yovanovich, J. R. Culham, and P. Teertstra, Electronics Cooling 3, 1 (1997).
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9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.