Spatial carrier-fringe pattern analysis by means of wavelet transform: Wavelet transform profilometry

Applied Optics

Volumn 43, Issue 26, 2004, Pages 4993-4998

  Zhong, Jingang ^a   Weng, Jiawen ^a  

^a JINAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEFORMATION; ERROR ANALYSIS; FOURIER TRANSFORMS; HOLOGRAPHIC INTERFEROMETRY; PROFILOMETRY; WAVELET TRANSFORMS;

CARRIER-FRINGE PATTERN; COMPLEX SIGNALS; GRATING PATTERNS; PATTERN ANALYSIS;

IMAGE PROCESSING;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; FOURIER ANALYSIS; IMAGE ENHANCEMENT; METHODOLOGY; THREE DIMENSIONAL IMAGING; VALIDATION STUDY;

ALGORITHMS; FOURIER ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; PATTERN RECOGNITION, AUTOMATED;

EID: 4944257336     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.004993     Document Type: Article

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