Far infrared characterization of samarium doped single crystal PbTe

Journal of Optoelectronics and Advanced Materials

Volumn 6, Issue 3, 2004, Pages 811-816

  Nikolic P M ^a   Konig W ^b   Lukovic D ^a   Savic S ^a   Vujatovic S ^a   Radulovic K ^c   Blagojevic V ^d  

^a INSTITUTE OF TECHNICAL SCIENCES   (Serbia)

^b Max Planck Inst Festkorperforsch   (Serbia)

^c IHTM   (Serbia)

^d University of Belgrade   (Serbia)

Author keywords

Far infrared reflectivity; Plasmon phonon interaction; Rear earth element

Indexed keywords

CRYSTAL IMPURITIES; INFRARED RADIATION; MATHEMATICAL MODELS; OPTOELECTRONIC DEVICES; PHONONS; SAMARIUM; SEMICONDUCTOR DOPING; SINGLE CRYSTALS;

FAR INFRARED CHRACTERIZATION; FAR-INFRARED REFLECTIVITY; PLASMON-PHONON INTERACTIONS;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 4944257169     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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