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Volumn 572, Issue 2, 2004, Pages 299-307

Spatially limited diffusion coupled with ohmic potential drop and/or slow interfacial exchange: A new method to determine the diffusion time constant and external resistance from potential step (PITT) experiments

Author keywords

Chronoamperometry; Interfacial charge transfer resistance; Linear diffusion; Ohmic effects; PITT

Indexed keywords

CHARGE CARRIERS; CHARGE TRANSFER; DISPERSIONS; ELECTROLYTES; MATHEMATICAL MODELS; OHMIC CONTACTS; OPTIMIZATION; PERTURBATION TECHNIQUES; SOLUTIONS; TITRATION;

EID: 4944250333     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2003.12.014     Document Type: Article
Times cited : (49)

References (31)
  • 3
    • 0001920459 scopus 로고
    • P.G. Bruce. Cambridge University Press. Chapter 8
    • Weppner W. Bruce P.G. Solid-State Electrochemistry. 1995;199 Cambridge University Press. Chapter 8.
    • (1995) Solid-state Electrochemistry , pp. 199
    • Weppner, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.