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Volumn 16, Issue , 2004, Pages 89-92

IPMs solving major reliability issues in automotive applications

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE ENGINEERING; COSTS; ELECTRIC VEHICLES; ELECTRONICS PACKAGING; INTERNAL COMBUSTION ENGINES; MICROPROCESSOR CHIPS; RELIABILITY; SHORT CIRCUIT CURRENTS;

EID: 4944248018     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (7)
  • 5
    • 4944244069 scopus 로고    scopus 로고
    • "Semiconductor device for controlling electricity", United States Patent No. 6,563,211, May
    • M. Fukada, H. Nishibori, T. Yoshida, N. Yoshimatsu, N. Kimoto, H. Takao: "Semiconductor device for controlling electricity", United States Patent No. 6,563,211, May, 2003.
    • (2003)
    • Fukada, M.1    Nishibori, H.2    Yoshida, T.3    Yoshimatsu, N.4    Kimoto, N.5    Takao, H.6
  • 7
    • 4944228393 scopus 로고    scopus 로고
    • Semiconductor protection circuit, United States Patent No. 2002 / 0176215, November
    • K. Hiyama, A. Yamamoto: Semiconductor protection circuit, United States Patent No. 2002 / 0176215, November, 2002.
    • (2002)
    • Hiyama, K.1    Yamamoto, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.