SCOPUS 정보 검색 플랫폼

Volumn 21, Issue 2, 1978, Pages 295-298

The use of dilation logic on the quantimet to achieve fractal dimension characterisation of textured and structured profiles

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49349121443 PISSN: 00325910 EISSN: None Source Type: Journal
DOI: 10.1016/0032-5910(78)80099-0 Document Type: Article

Times cited : (139)

References (7)

1
- 84916668658
- Characterisation of the surface area of a fine-particle profile by its fractal dimension
- presented at the, Proceedings of the Conference, to be published in the
- Salford Conference on Particle Size Analysis
- Kaye¹

2
- 0002503388
- Specification of the ruggedness and/or texture of a fine-particle profile by its fractal dimension
- (1978) Powder Technol. , vol.21 , pp. 1
- Kaye¹

3
- 0002247276
- The New Quantimet 720
- (1971) Microscope , vol.19 , pp. 1-20
- Fisher¹

4
- 0003666299
- W. H. Freeman and Co, San Francisco
- (1977) Fractals Form Chance and Dimension
- Mandelbrot¹

5
- 84902608743
- Stereology and structuring elements
- (Pt. 1)
- (1972) Journal of Microscopy , vol.95 , pp. 93-103
- Serra¹

6
- 0015035725
- Dynamic shape factors of particles
- Powder Technol. , vol.4 , pp. 117-138
- Medalia¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.