Transient growth and thinning of the barrier oxide layer on iron measured by real-time spectroscopic ellipsometry

Electrochimica Acta

Volumn 53, Issue 26, 2008, Pages 7696-7702

  Lu, Zijie ^a   Macdonald, Digby D ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Barrier oxide layer; Iron; Passivity; Spectroscopic ellipsometry; Transient growth and thinning

Indexed keywords

CURRENT DENSITY; ECOLOGY; ELLIPSOMETRY; IRON OXIDES; POINT DEFECTS; SPECTROSCOPIC ELLIPSOMETRY;

APPLIED POTENTIALS; BARRIER LAYER; BARRIER OXIDE LAYER; BARRIER-LAYER THICKNESS; BORATE BUFFER SOLUTIONS; CATHODIC DIRECTION; DISODIUM SALTS; ELLIPSOMETRIC MEASUREMENTS; ETHYLENE DIAMINE TETRA ACETIC ACID; IRON; OUTER LAYERS; PASSIVE FILM ON IRON; PASSIVE FILMS; PASSIVITY; POINT DEFECT MODEL; POTENTIOSTATIC CONTROL; REAL-TIME SPECTROSCOPIC ELLIPSOMETRY; STEADY-STATE CURRENTS; TRANSIENT GROWTH; TRANSIENT GROWTH AND THINNING;

FILM GROWTH;

EID: 49349116495     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2008.05.021     Document Type: Article

References (41)

1. Nagayama M., and Cohen M. J. Electrochem. Soc. 109 (1962) 781
2. Nagayama M., and Cohen M. J. Electrochem. Soc. 110 (1963) 670
3. Sato N., and Cohen M. J. Electrochem. Soc. 111 (1964) 512
4. Sato N., Noda T., and Kudo K. Electrochim. Acta 19 (1974) 471
5. Cahan B.D., and Chen C.T. J. Electrochem. Soc. 129 (1982) 474
6. Kruger J. Corros. Sci. 29 (1989) 149
7. Schmuke P., Virtanen S., Davenport A., and Vitus C. J. Electrochem. Soc. 143 (1996) 574
8. Ohtsuka T., and Ohta A. Mater. Sci. Eng. A 198 (1995) 169
9. Ohtsuka T., and Yamada H. Corros. Sci. 40 (1998) 1131
10. Sikora E., and Macdonald D.D. J. Electrochem. Soc. 147 (2000) 4087
11. Liu J., and Macdonald D.D. J. Electrochem. Soc. 148 (2001) B425
12. Macdonald D.D. Pure Appl. Chem. 71 (1999) 951
13. Macdonald D.D., Biaggio S.R., and Song H. J. Electrochem. Soc. 139 (1992) 170
14. Buchler M., Schmuki P., Bohni H., Stenberg T., and Mantyla T. J. Electrochem. Soc. 145 (1998) 378
15. Leibenguth J.L., and Cohen M. J. Electrochem. Soc. 119 (1972) 87
16. Hashimoto K., and Cohen M. J. Electrochem. Soc. 121 (1974) 37
17. Bockris J.O.M. Corros. Sci. 29 (1989) 291
18. Chen C.T., and Cahan B.D. J. Electrochem. Soc. 129 (1982) 17
19. Battaglia V., and Newman J. J. Electrochem. Soc. 142 (1995) 1423
20. Davenport A.J., et al. J. Electrochem. Soc. 147 (2000) 2162
21. Verwey E.J.W. Physica 2 (1935) 1059
22. Macdonald D.D., Sikora E., and Sikora J. Electrochim. Acta 43 (1998) 2851
23. Vetter K.J. Electrochim. Acta 16 (1971) 1923
24. Kirchheim R. Electrochim. Acta 32 (1987) 1619
25. Macdonald D.D., and Urquidi-Macdonald M. J. Electrochem. Soc. 137 (1990) 2395
26. Macdonald D.D. J. Electrochem. Soc. 139 (1992) 3434
27. Szklarska-Smialowska Z., Zakroczymski T., and Fan C.J. J. Electrochem. Soc. 132 (1985) 2543
28. Sato N., and Noda T. Electrochim. Acta 22 (1977) 839
29. Scklarska-Smialowska Z., and Kozolowski W. J. Electrochem. Soc. 131 (1984) 234
30. I. An, Ph.D. Thesis, The Pennsylvania State University, 1992.
31. B. Marx, Ph.D. Thesis, The Pennsylvania State University, 2006.
32. Ohtsuka T., Ju J.C., Ito S., and Einaga H. Corros. Sci. 36 (1994) 1257
33. Tanaka S., Hara N., and Sugimoto K. Mater. Sci. Eng. A 198 (1995) 63
34. Buchler M., Schmuki P., and Bohni H. J. Electrochem. Soc. 144 (1997) 2307
35. Kruger J., and Calvert J.P. J. Electrochem. Soc. 114 (1967) 43
36. Goetz R., Mitchell D.F., MacDougall B., and Graham M.J. J. Electrochem. Soc. 134 (1987) 535
37. Oblonsky L.J., Ryan M.P., and Isaacs H.S. Corros. Sci. 42 (2000) 229
38. Deng H., Nanjo H., Qian P., Santosa A., Ishikawa I., and Kurata Y. Electrochim. Acta 52 (2007) 4272
39. Graham M.J., Bardwell J.A., Goetz R., Mitchell D.F., and MacDougall B. Corros. Sci. 31 (1990) 139
40. Bardwell J.A., Sproule G.I., Mitchell D.F., MacDougall B., and Graham M.J. J. Chem. Soc., Faraday Trans. 87 (1991) 1011
41. Eldridge J., and Hoffman R.W. J. Electrochem. Soc. 136 (1989) 955