When the pursuit of quality risks innovation

TQM Journal

Volumn 20, Issue 2, 2008, Pages 130-142

  Cole, Robert E ^a   Matsumiya, Tsuyoshi ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b DOSHISHA UNIVERSITY   (Japan)

Author keywords

Innovation; Quality; Reliability management; Risk assessment; Time to market

Indexed keywords

RANDOM ACCESS STORAGE;

DESIGN/METHODOLOGY/APPROACH; DYNAMIC RANDOM ACCESS MEMORIES; EARLY STAGES; HI-TECH; HI-TECH PRODUCTS; INNOVATION; JAPANESE FIRMS; NETWORK EQUIPMENTS; PRODUCT CYCLES; QUALITY; QUALITY CULTURE; QUALITY IMPROVEMENT; QUALITY RISKS; RADICAL INNOVATION; RELIABILITY MANAGEMENT; RISK ASSESSMENT; RISK AVERSE; SYSTEM INTEGRATION; TIME TO MARKET;

TECHNOLOGY;

EID: 49349089378     PISSN: 17542731     EISSN: None     Source Type: Journal    
DOI: 10.1108/17542730810857363     Document Type: Article

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