Seeded fault testing and in-situ analysis of critical electronic components in EMA power circuitry

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2008, Pages

  Baybutt, Mark ^a   Nanduri, Sashank ^a   Kalgren, Patrick W ^a   Bodden, David S ^b   Clements, N Scott ^b   Alipour, Saeed ^c  

^a IMPACT TECHNOLOGIES LLC   (United States)

^b LOCKHEED MARTIN   (United States)

^c Parker Aerospace Group   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED AGEING; COLLABORATIVE WORKS; CONTROL CIRCUITRY; CONTROL ELECTRONICS; CRITICAL COMPONENTS; DETECTION STRATEGIES; ELECTROMECHANICAL ACTUATOR; ELECTRONIC COMPONENTS; FAULT TESTING; HIGHLY ACCELERATED LIFE TESTING; IN-SITU; LOCKHEED; LOCKHEED MARTIN AERONAUTICS COMPANY; SPECIFIC KNOWLEDGE; SYSTEM TESTING; TEST RESULTS; TEST SYSTEMS;

CONTROL SYSTEMS; ELECTRIC FAULT CURRENTS; ELECTROMECHANICAL DEVICES; FAILURE ANALYSIS; PLANNING; QUALITY ASSURANCE; RELIABILITY; STRATEGIC PLANNING; TESTING;

IMPACT TESTING;

EID: 49349085419     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2008.4526606     Document Type: Conference Paper

References (7)

1. Control Actuation System Interface Control Document (ICD). Parker Aerospace Control Systems Division.
2. Control Actuation System Reliability and Safety Analysis Report. Parker Aerospace Control Systems Division.
3. Control Actuation System Reliability and Safety Analysis Report, Appendix B: BIT Effectiveness Calculations, Parker Aerospace Control Systems Division.
4. Renesas Semiconductor Device Reliability Handbook. 2006
5. IRF510S: HEXFET Power MOSFET. International Rectifier, Datasheet, pp. 1.
6. IRFP2907: HEXFET Power MOSFET. International Rectifier, Datasheet, June 2005, pp. 1.
7. W. Meskan, Film Capacitors: What Are They & How Are They Made. Plastic Capacitors, Inc, 1998