Charge-carrier plasma dynamics during the reverse-recovery period in p+-n--n+ diodes

IEEE Transactions on Electron Devices

Volumn 55, Issue 8, 2008, Pages 2164-2172

  Baburske, Roman ^a   Heinze, Birk ^a   Lutz, Josef ^a   Niedernostheide, Franz Josef ^b  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

Dynamic behavior; Plasma; Power diodes; Reverse recovery; Turnoff

Indexed keywords

AVALANCHES (SNOWSLIDES); CIVIL AVIATION; DYNAMICS; MAGNETIC FIELD EFFECTS; MAGNETOHYDRODYNAMICS; NONMETALS; PLASMA DIAGNOSTICS; PLASMAS; SILICON; SILICON CARBIDE; SNOW;

CARRIER PLASMAS; DYNAMIC BEHAVIOR; PLASMA; POWER DIODES; RECOVERY PERIOD; REVERSE RECOVERY; SILICON CARBIDE DEVICES; SWITCHING CONDITIONS; TURNOFF;

CHARGE CARRIERS;

EID: 49249125030     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.926748     Document Type: Article

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