메뉴 건너뛰기




Volumn 3, Issue , 2006, Pages 2406-2411

Induction motor fault detection by using Wavelet decomposition on dq0 components

Author keywords

dq0 transform; Electrical drives; Fault detection; Induction motor; Inter turns shorts; Wavelet analysis

Indexed keywords

DAMAGE DETECTION; ELECTRIC CURRENTS; ELECTRIC FAULT LOCATION; INDUCTION MOTORS; INDUSTRIAL APPLICATIONS; INDUSTRIAL ELECTRONICS; LOCATION; MAINTENANCE; MATHEMATICAL TRANSFORMATIONS; MOTORS; OUTAGES; PARKS; REPAIR; SIGNAL ANALYSIS; SIGNAL PROCESSING; STATORS; WAVELET DECOMPOSITION; WAVELET TRANSFORMS;

EID: 49249103131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2006.295949     Document Type: Conference Paper
Times cited : (28)

References (9)
  • 2
    • 0033309003 scopus 로고    scopus 로고
    • S. Nandi, H. A. Toliyat, Condition monitoring and fault diagnosis of electrical machines - a review, IEEE IAS Thirty-Fourth Meeting Industry Applications Annual Conference, 1, pp. 197-204, 3-7, Oct. 1999.
    • S. Nandi, H. A. Toliyat, "Condition monitoring and fault diagnosis of electrical machines - a review," IEEE IAS Thirty-Fourth Meeting Industry Applications Annual Conference, vol. 1, pp. 197-204, 3-7, Oct. 1999.
  • 3
    • 0034297416 scopus 로고    scopus 로고
    • A Review of Induction Motors Signature Analysis as a Medium for Faults Detection
    • October
    • M. E. H. Benbouzid, "A Review of Induction Motors Signature Analysis as a Medium for Faults Detection," IEEE Transaction on Industrial Electronics, vol. 47, no. 5, pp. 984-993, October 2000.
    • (2000) IEEE Transaction on Industrial Electronics , vol.47 , Issue.5 , pp. 984-993
    • Benbouzid, M.E.H.1
  • 6
    • 2942635632 scopus 로고    scopus 로고
    • Induction Machine Fault Diagnostic Analysis with Wavelet Technique
    • June
    • Tommy W. S. Chow and Shi Hai: "Induction Machine Fault Diagnostic Analysis with Wavelet Technique", IEEE Transactions on Industrial Electronics, vol 51, no 3, June 2004
    • (2004) IEEE Transactions on Industrial Electronics , vol.51 , Issue.3
    • Chow, T.W.S.1    Hai, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.