On-chip microwave test circuits for production IC measurements

64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004

Volumn , Issue , 2004, Pages 213-219

  Eisenstadt, William R ^a   Fox, Robert M ^a   Yin, Qizhang ^a   Yoon, Jang Sup ^a   Zhang, Tao ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL COMMUNICATION SYSTEMS; MICROWAVES; SIGNAL SAMPLING;

DETECTION CIRCUITS; EMBEDDED TESTS; MICROWAVE SIGNALS; MICROWAVE TEST; ON-CHIP CIRCUITS; PEAK DETECTORS; RECENT PROGRESS; RMS DETECTORS;

COUPLED CIRCUITS;

EID: 49249100228     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2004.1427602     Document Type: Conference Paper

References (5)

1. Yoon, and W. R. Eisenstadt, "Lumped Passive Circuits for 5GHz Embedded Test of RF SoCs", ISCAS 2004, Vancouver, Canada, May 23-26.
2. T. Zhang, W. R. Eisenstadt and R. M. Fox, "A Novel 5GHz RF Power Detector", ISCAS 2004, Vancouver, Canada, May 23-26, 2004.
3. Q. Yin, W. R. Eisenstadt and R. M. Fox, "A Translinear-Based RF RMS Detector for Embedded Test", ISCAS 2004, Vancouver, Canada, May 23-26, 2004.
4. R. G. Meyer, "Low-Power Monolithic RF Peak Detector analysis", IEEE J. Solid-State Circuits, Vol. 30. No. 1, Jan S1995.
5. T. Zhang, W. R. Eisenstadt, and R. M. Fox, "Embedded Self Test for a 5 GHz LNA", accepted to 1st IEEE International GHz/Gbps Test Workshop (GTW04J Charlotte, NC, USA, 28-29 Oct. 2004.