-
1
-
-
0033633741
-
-
W. P. McConnell, J. P. Novak, L. C. Brousseau, III, R. R. Fuierer, R. C. Tenent, and D. L. Feldheim, J. Phys. Chem. B 104, 8925 (2000).
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 8925
-
-
McConnell, W.P.1
Novak, J.P.2
Brousseau III, L.C.3
Fuierer, R.R.4
Tenent, R.C.5
Feldheim, D.L.6
-
2
-
-
18044387790
-
-
C. Burda, X. Chen, R. Narayanan, and M. A. El-Sayed, Chem. Rev. 105, 1025 (2005).
-
(2005)
Chem. Rev
, vol.105
, pp. 1025
-
-
Burda, C.1
Chen, X.2
Narayanan, R.3
El-Sayed, M.A.4
-
5
-
-
16244408029
-
-
D. A. Stuart, A. J. Haes, C. R. Yonzon, E. M. Hicks, and R. P. Van Duyne, IEE Proc. -Nanobiotechnol. 152, 13 (2005).
-
(2005)
IEE Proc. -Nanobiotechnol
, vol.152
, pp. 13
-
-
Stuart, D.A.1
Haes, A.J.2
Yonzon, C.R.3
Hicks, E.M.4
Van Duyne, R.P.5
-
7
-
-
0037127714
-
-
C. Sönnichsen, T. Franzl, T. Wilk, G. von Plessen, J. Feldmann, O. Wilson, and P. Mulvaney, Phys. Rev. Lett. 88, 077402 (2002).
-
(2002)
Phys. Rev. Lett
, vol.88
, pp. 077402
-
-
Sönnichsen, C.1
Franzl, T.2
Wilk, T.3
von Plessen, G.4
Feldmann, J.5
Wilson, O.6
Mulvaney, P.7
-
10
-
-
0142011551
-
-
K.-H. Su, Q.-H. Wei, X. Zhang, J. J. Mock, D. R. Smith, and S. Schultz, Nano Lett. 3, 1087 (2003).
-
(2003)
Nano Lett
, vol.3
, pp. 1087
-
-
Su, K.-H.1
Wei, Q.-H.2
Zhang, X.3
Mock, J.J.4
Smith, D.R.5
Schultz, S.6
-
11
-
-
37149017374
-
-
A. K. Sheridan, A. W. Clark, A. Glidle, J. M. Cooper, and D. R. S. Cumming, J. Vac. Sci. Technol. B 25, 2628 (2007).
-
(2007)
J. Vac. Sci. Technol. B
, vol.25
, pp. 2628
-
-
Sheridan, A.K.1
Clark, A.W.2
Glidle, A.3
Cooper, J.M.4
Cumming, D.R.S.5
-
12
-
-
0037461639
-
-
K. L. Kelly, E. Coronado, L. L. Zhao, and G. C. Schatz, J. Phys. Chem. B 107, 668 (2003).
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 668
-
-
Kelly, K.L.1
Coronado, E.2
Zhao, L.L.3
Schatz, G.C.4
-
16
-
-
33748573275
-
-
B. J. Wiley, S. H. Im, Z. Y. Li, J. McLellan, A. Siekkinen, and Y. Xia, J. Phys. Chem. B 110, 15666 (2006).
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 15666
-
-
Wiley, B.J.1
Im, S.H.2
Li, Z.Y.3
McLellan, J.4
Siekkinen, A.5
Xia, Y.6
-
20
-
-
0142011551
-
-
K. H. Su, Q.-H. Wei, X. Zhang, J. J. Mock, D. R. Smith, and S. Schultz, Nano Lett. 3, 1087 (2003).
-
(2003)
Nano Lett
, vol.3
, pp. 1087
-
-
Su, K.H.1
Wei, Q.-H.2
Zhang, X.3
Mock, J.J.4
Smith, D.R.5
Schultz, S.6
-
22
-
-
33644929826
-
-
San Jose, CA
-
M. S. Guzman, M. Hack, and G, Neubauer, IEEE Int. Reliab. Phys. Symp. Proc. 32th annual pp. 108 (San Jose, CA, 1994)
-
(1994)
IEEE Int. Reliab. Phys. Symp. Proc. 32th annual
, pp. 108
-
-
Guzman, M.S.1
Hack, M.2
Neubauer, G.3
-
23
-
-
4043160613
-
-
M. J. Cordill, D. F. Bahr, N. R. Moody, and W. W. Gerberich, IEEE Trans. Dev. Mater. Reliab. 4, 163 (2004).
-
(2004)
IEEE Trans. Dev. Mater. Reliab
, vol.4
, pp. 163
-
-
Cordill, M.J.1
Bahr, D.F.2
Moody, N.R.3
Gerberich, W.W.4
|