Structural and magnetic properties of CoFe2O4 thin films deposited by laser ablation on Si (001) substrates

Vacuum

Volumn 82, Issue 12, 2008, Pages 1437-1440

  Araujo C ^a   Almeida, B G ^a   Aguiar, M ^a   Mendes, J A ^a,b  

^a UNIVERSITY OF MINHO   (Portugal)

^b Inst Politécnico do Porto   (Portugal)

Author keywords

CoFe2O4 thin films; Laser ablation; Magnetic properties; Residual antiferromagnetic phases; Si (001) substrate; Structural properties

Indexed keywords

COBALT; MAGNETIC PROPERTIES; TRANSITION METALS;

COBALT FERRITES; COFE2O4 THIN FILMS; LASER ABLATION; RESIDUAL ANTIFERROMAGNETIC PHASES; SI (001) SUBSTRATE; STRUCTURAL AND MAGNETIC PROPERTIES; STRUCTURAL PROPERTIES;

FERRITES;

EID: 49149118495     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2008.03.014     Document Type: Article

References (13)

1. Maat S., Carey M.J., Fullerton E.E., Le T.X., Rice P.M., and Gurney B.A. Appl Phys Lett 81 (2002) 520
2. Carey M.J., Maat S., Rice P., Farrow R.F.C., Marks R.F., Kellock A., et al. Appl Phys Lett 81 (2002) 1044
3. Lisfi A., Lodder J.C., Keim E.G., and Williams C.M. Appl Phys Lett 82 (2003) 76
4. Grigorova M., Blythe H.J., Blaskov V., Rusanov V., Petkov V., Masheva V., et al. J Magn Magn Mater 183 (1998) 163
5. Zheng H., Wang J., Lofland S.E., Ma Z., Mohaddes-Ardabili L., Zhao T., et al. Science 303 (2004) 661
6. Wan J.G., Wang X.W., Wu Y.J., Zeng M., Wang Y., Jiang H., et al. Appl Phys Lett 86 (2005) 122501
7. Chikazumi S. Physics of ferromagnetism (1997), Oxford University Press, New York
8. Hu G., Choi J.H., Eom C.B., Harris V.G., and Suzuki Y. Phys Rev B 62 (2000) R779
9. Cullity B.D. Elements of X-ray diffraction (1978), Addison-Wesley, Reading, MA
10. In: Chrisey D., and Hubler G. (Eds). Pulsed laser deposition of thin films (1994), Wiley, New York
11. Powder Diffraction File, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, 2004; Cards 22-1086, 48-1719 and 46-1312.
12. Dorsey P.C., Lubitz P., Chrisey D.B., and Horwitz J.S.J. Appl Phys 79 (1996) 6338
13. Viart N., Rebmann G., Pourroy G., Loison J.L., Versini G., Huber F., et al. Thin Solid Films 471 (2005) 40