|
Volumn 16, Issue 16, 2008, Pages 12108-12113
|
Three laser two-tone setup for measurement of photodiode intercept points
|
Author keywords
[No Author keywords available]
|
Indexed keywords
INTERMODULATION DISTORTION;
MODULATORS;
SUPERCONDUCTING FILMS;
ANALOG LINKS;
DIFFERENT SLOPES;
INTERCEPT POINTS;
MODULATION DEPTH;
OPTICAL POWER;
SECOND ORDER INTERCEPT POINTS;
THIRD ORDER INTERMODULATION DISTORTION;
THIRD ORDER INTERMODULATION PRODUCTS;
PHOTODIODES;
ALGORITHM;
ARTICLE;
EQUIPMENT;
EQUIPMENT DESIGN;
ILLUMINATION;
INSTRUMENTATION;
LASER;
METHODOLOGY;
SEMICONDUCTOR;
ALGORITHMS;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
LASERS;
LIGHTING;
SEMICONDUCTORS;
|
EID: 49149118482
PISSN: None
EISSN: 10944087
Source Type: Journal
DOI: 10.1364/OE.16.012108 Document Type: Article |
Times cited : (20)
|
References (9)
|