Secondary electron emission at Langmuir probe surface

Journal of Optoelectronics and Advanced Materials

Volumn 10, Issue 8, 2008, Pages 2011-2014

  Solomon, M L ^a   Teodoru, S ^a   Popa, G ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Electrostatic probes; Plasma diagnostics; Secondary electron emission

Indexed keywords

ELECTRON BEAMS; ELECTRON GUNS; ELECTRONS; KINETIC ENERGY; KINETICS; LANGMUIR PROBES; PLASMA DIAGNOSTICS; PLASMA SIMULATION;

CURRENT INTENSITY; ELECTROSTATIC PROBE; HIGH-ENERGY PARTICLES; IV CHARACTERISTICS; KINETIC ELECTRONS; PIC SIMULATION; SECONDARY ELECTRON EMISSIONS; SOLID-STATE MATERIALS;

SECONDARY EMISSION;

EID: 49149096035     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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