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When we characterized the surfaces of pentacene film before and after exposed to tetradecane as an organic solvent by using atomic force microscopy (AFM), the root mean square value of the surface was changed from 8 nm to 58 nm.
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When we characterized the surfaces of pentacene film before and after exposed to tetradecane as an organic solvent by using atomic force microscopy (AFM), the root mean square value of the surface was changed from 8 nm to 58 nm.
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49149125783
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note
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The size of the silver dots on the substrate is measured by using AFM, while the volume of a single silver ink droplet ejected from the inkjet head is estimated by multiplying the measured size by ten, which gives the Ag content in the solution.
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49149120364
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Organic transistors with Au source/drain electrodes fabricated by vacuum evaporation are prepared as the reference device. The mobility and on-off ratio of the reference device are 0.5 cm2 /V s and 106, respectively.
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Organic transistors with Au source/drain electrodes fabricated by vacuum evaporation are prepared as the reference device. The mobility and on-off ratio of the reference device are 0.5 cm2 /V s and 106, respectively.
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