Growth and structural characterization of (0.2) Bi (Zn12 Ti12) O3 - (0.8) PbTi O3 epitaxial thin films by off-axis rf sputtering

Applied Physics Letters

Volumn 93, Issue 4, 2008, Pages

  Kwon, Daeyoung ^a   Kim, Bongju ^a   Tong, P ^a   Kim, Bog G ^a  

^a Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH PLATING; EPITAXIAL FILMS; FERROELECTRIC FILMS; HETEROJUNCTIONS; MAGNETRON SPUTTERING; MOLECULAR BEAM EPITAXY; OZONE WATER TREATMENT; SOLIDS; SUBSTRATES; THICK FILMS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

EPITAXIAL THIN FILMS; FILM-THICKNESS; HIGH-QUALITY THIN FILMS; MISFIT DISLOCATIONS; OFF-AXIS; PBTI O3; R F SPUTTERING; RF-MAGNETRON SPUTTERING; SRTI O3 SUBSTRATES; STRUCTURAL CHARACTERIZATIONS; STRUCTURAL DEVELOPMENTS; SYNCHROTRON X-RAY DIFFRACTION; X-RAY REFLECTIVITY;

EPITAXIAL GROWTH;

EID: 49149091518     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2965462     Document Type: Article

References (18)

1. C. A-Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature (London) 374, 627 (1995).
2. J. F. Scott and C. A. P. Dearaujo, Science 246, 1400 (1989).
3. M. Dawber, K. M. Rabe, and J. F. Scott, Rev. Mod. Phys. 77, 1083 (2005).
4. K. J. Choi, M. Biegalski, Y. L. Li, A. Sharan, J. Schubert, R. Uecker, P. Reiche, Y. B. Chen, X. Q. Pan, V. Gopalan, L.-Q. Chen, D. G. Schlom, and C. B. Eom, Science 306, 1005 (2004).
5. J. H. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, Y. L. Li, S. Choudhury, W. Tian, M. E. Hawley, B. Craigo, A. K. Tagantsev, X. Q. Pan, S. K. Streiffer, L. Q. Chen, S. W. Kirchoefer, J. Levy, and D. G. Schlom, Nature (London) 430, 758 (2004).
6. H. N. Lee, H. M. Christen, M. F. Chisholm, C. M. Rouleau, and D. H. Lowndes, Nature (London) 433, 359 (2005).
7. M. Dawber, N. Stucki, C. Lichtensteiger, S. Gariglio, P. Ghosez, and J.-M. Triscone, Adv. Mater. (Weinheim, Ger.) 19, 4153 (2007).
8. M. R. Suchomel and P. K. Davies, Appl. Phys. Lett. 86, 262905 (2005).
9. I. Grinberg and A. M. Rappe, Phys. Rev. Lett. 98, 037603 (2007).
10. X. D. Zhang, D. Kwon, and Bog G. Kim, Appl. Phys. Lett. 92, 082906 (2008).
11. I. Grinberg, M. R. Suchomel, P. K. Davies, and A. M. Rappe, J. Appl. Phys. 98, 094111 (2005).
12. C. Braun, PARRATT32 program, Berlin Neutron Scattering Center (BENSC), Hahn-Meitner Institute, Berlin.
13. F. Family and T. Vicsek, J. Phys. A 18, L75 (1985).
14. Y. H. Xie, G. H. Gilmer, C. Roland, P. J. Silverman, S. K. Buratto, J. Y. Cheng, E. A. Fitzgerald, A. R. Kortan, S. Schuppler, M. A. Marcus, and P. H. Citrin, Phys. Rev. Lett. 73, 3006 (1994).
15. J. Villain, J. Phys. I 1, 19 (1991).
16. Z.-W. Lai and S. Das Sarma, Phys. Rev. Lett. 66, 2348 (1991).
17. B. E. Warren, X-ray Diffraction (Dover, New York, 1969).
18. S. Gariglio, N. Stucki, J.-M. Triscone, and G. Triscone, Appl. Phys. Lett. 90, 202905 (2007).