Thermal budget optimization on Strained Silicon-On-Insulator (SSOI) CMOS

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2008, Pages 118-119

  Huang, R M ^a   Lin, Y H ^a   Tsai, S H ^a   Yang, C W ^a   Liu, E C ^a   Hsieh, Y S ^a   Cayrefourcq, Ian ^b   Tsai, C T ^a   Ma, G H ^a  

^a UNITED MICROELECTRONICS CORPORATION   (Taiwan)

^b PARC TECHNOLOGIQUE DES FONTAINES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSENSORS; NONMETALS; OPTIMIZATION; SECURITY SYSTEMS; SULFATE MINERALS; TECHNOLOGY;

DRIVE CURRENTS; INDUCED STRESSES; INTERNATIONAL SYMPOSIUM; PERFORMANCE DEGRADATION; STRAINED SILICON-ON-INSULATOR; THERMAL PROCESSING; VLSI TECHNOLOGIES;

SILICON;

EID: 49049115521     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2008.4530825     Document Type: Conference Paper

References (4)

1. Processor Spotlight: MPC7447A, COTS Journal,Jul 2004.
2. C.W. Moore, "What's Around the next bend in the Powerbook / ibookRoad", www.applelinks.com, Oct 08, 2004.
3. Uchida et. al., IEDM Tech. Dig. p. 229, 2004.
4. Y. C. Liu et al., IEDM, p. 836, 2005.