Future memory technology: Challenges and opportunities

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2008, Pages 5-9

  Kim, Kinam ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

RANDOM ACCESS STORAGE; SECURITY SYSTEMS; TECHNOLOGY;

FUTURE MEMORY; INTERNATIONAL SYMPOSIUM; NAND FLASH; NON-VOLATILE RANDOM ACCESS MEMORIES; TECHNICAL CHALLENGES; VLSI TECHNOLOGIES;

DATA STORAGE EQUIPMENT;

EID: 49049108116     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2008.4530774     Document Type: Conference Paper

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