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Volumn , Issue , 2008, Pages 134-135

Optimized scaling of diode array design for 32NM node phase change memory

Author keywords

[No Author keywords available]

Indexed keywords


EID: 49049084423     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2008.4530833     Document Type: Conference Paper
Times cited : (9)

References (1)
  • 1
    • 46049090421 scopus 로고    scopus 로고
    • Full Integration of Highly Manufacturable 512Mb PRAM based on 90nm Technology
    • Dec
    • J.H. Oh, et. al., "Full Integration of Highly Manufacturable 512Mb PRAM based on 90nm Technology," in IEDM .Tech. Dig., Dec. 2006.
    • (2006) IEDM .Tech. Dig
    • Oh, J.H.1    et., al.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.