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Volumn 463, Issue 1-2, 2008, Pages 34-37

Crystal structure, thermal expansion and electrical properties of the new Al0.32ErGe2 compound

Author keywords

Crystal structure; Intermetallics; Thermal expansion; X ray diffraction

Indexed keywords

ALUMINUM; ELECTRIC PROPERTIES; THERMAL EXPANSION; THERMAL SPRAYING;

EID: 48949118520     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.09.018     Document Type: Article
Times cited : (6)

References (13)
  • 3
    • 48949111560 scopus 로고    scopus 로고
    • N. Nakonechna, V. Kuprysyuk, T. Yanson, R. Gladyshevskii, Visn. Lviv. Univ., Ser. Khim. 40 (2001) 68-72.
    • N. Nakonechna, V. Kuprysyuk, T. Yanson, R. Gladyshevskii, Visn. Lviv. Univ., Ser. Khim. 40 (2001) 68-72.
  • 8
    • 48949111559 scopus 로고    scopus 로고
    • Jade5.XRD Pattern Processing, Materials Data, Inc., 1999.
    • Jade5.XRD Pattern Processing, Materials Data, Inc., 1999.
  • 10
    • 48949111549 scopus 로고    scopus 로고
    • H. Marciniak, R. Diduszko, DMPLOT-Plot View Program for Rietveld Refinement Method, Version 3.38, 1997.
    • H. Marciniak, R. Diduszko, DMPLOT-Plot View Program for Rietveld Refinement Method, Version 3.38, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.