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Volumn 104, Issue 2, 2008, Pages
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Phonon-defect scattering in doped silicon by molecular dynamics simulation
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Author keywords
[No Author keywords available]
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Indexed keywords
CONCENTRATION (PROCESS);
DYNAMICS;
MIXING;
MOLECULAR DYNAMICS;
NANOFLUIDICS;
NONMETALS;
PARAMETER ESTIMATION;
PHONONS;
POINT DEFECTS;
QUANTUM CHEMISTRY;
SCATTERING;
SILICON;
THERMAL CONDUCTIVITY;
DOPED SILICON;
MODE MIXING;
MOLECULAR DYNAMICS SIMULATION;
MOLECULAR DYNAMICS SIMULATIONS;
MULTIPLE-SCATTERING;
PHONON DENSITY OF STATES;
PHONON FIELDS;
PHONON SCATTERING PROCESS;
PHONON WAVE PACKETS;
PHONON-DEFECT SCATTERING;
RELATIVE AMOUNTS;
SCATTERING STRENGTH;
DEFECTS;
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EID: 48849110986
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2959840 Document Type: Article |
Times cited : (10)
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References (14)
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