Interlaboratory comparison of positron annihilation lifetime measurements for synthetic fused silica and polycarbonate

Journal of Applied Physics

Volumn 104, Issue 2, 2008, Pages

  Ito, Kenji ^a   Oka, Toshitaka ^a,c   Kobayashi, Yoshinori ^a   Shirai, Yasuharu ^b   Wada, Ken'Ichiro ^b   Matsumoto, Masataka ^b   Fujinami, Masanori ^c   Hirade, Tetsuya ^d   Honda, Yoshihide ^b   Hosomi, Hiroyuki ^e   Nagai, Yasuyoshi ^f   Inoue, Koji ^f   Saito, Haruo ^g   Sakaki, Koji ^h   Sato, Kiminori ⁱ   Shimazu, Akira ^j   Uedono, Akira ^k  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c CHIBA UNIVERSITY   (Japan)

^d JAPAN ATOMIC ENERGY AGENCY   (Japan)

^e TORAY RESEARCH CENTER INC   (Japan)

^f TOHOKU UNIVERSITY   (Japan)

^g UNIVERSITY OF TOKYO   (Japan)

^h NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

ⁱ TOKYO GAKUGEI UNIVERSITY   (Japan)

^j Tokyo Institute of Technology   (Japan)

^k UNIVERSITY OF TSUKUBA   (Japan)

more..

Author keywords

[No Author keywords available]

Indexed keywords

PLASTIC PRODUCTS; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; SILICA; SILICATE MINERALS; SILICON COMPOUNDS; STATISTICAL METHODS; SUPERCONDUCTING MATERIALS; UNCERTAINTY ANALYSIS;

DATA ANALYSIS; INTER-LABORATORY COMPARISON; POSITRON ANNIHILATION LIFETIME; POSITRON LIFETIMES; SYNTHETIC FUSED SILICA;

FUSED SILICA;

EID: 48849109121     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2957074     Document Type: Article

References (16)

1. Positron Solid-State Physics, edited by, W. Brandt, and, A. Dupasquier, (North-Holland, Amsterdam, 1983).
2. O. E. Mogensen, Positron and Positronium Chemistry (Springer, Berlin, 1995).
3. Positron Annihilation in Semiconductors: Defect Studies, edited by, R. Krause-Rehberg, and, H. S. Leipner, (Springer, Berlin, 2003).
4. S. J. Tao, J. Chem. Phys. 0021-9606 10.1063/1.1677067 56, 5499 (1972).
5. M. Eldrup, D. Lightbody, and J. N. Sherwood, Chem. Phys. 0301-0104 10.1016/0301-0104(81)80307-2 63, 51 (1981).
6. K. Ciesielski, A. L. Dawidowicz, T. Goworek, B. Jasińska, and J. Wawryszczuk, Chem. Phys. Lett. 0009-2614 10.1016/S0009-2614(98)00416-3 289, 41 (1998).
7. K. Ito, H. Nakanishi, and Y. Ujihira, J. Phys. Chem. B 1089-5647 10.1021/jp9831841 103, 4555 (1999).
8. D. W. Gidley, W. E. Frieze, T. L. Dull, A. F. Yee, E. T. Ryan, and H. -M. Ho, Phys. Rev. B 0163-1829 10.1103/PhysRevB.60.R5157 60, R5157 (1999).
9. C. Wästlund, M. Eldrup, and F. H. J. Maurer, Nucl. Instrum. Methods Phys. Res. B 0168-583X 10.1016/S0168-583X(98)00400-5 143, 575 (1998).
10. R. D. Goldberg, A. P. Knights, P. J. Simpson, and P. G. Coleman, J. Appl. Phys. 0021-8979 10.1063/1.370735 86, 342 (1999).
11. H. Saito, Y. Nagashima, T. Kurihara, and T. Hyodo, Nucl. Instrum. Methods Phys. Res. A 0168-9002 10.1016/S0168-9002(01)02172-6 487, 612 (2002).
12. This does not mean that a lower signal-to-noise ratio (S/N) is preferable. Rather, it means that the background level should be larger than 15 irrespective of S/N.
13. T. Chang, D. Yin, C. Cao, S. Wang, and J. Liang, Nucl. Instrum. Methods Phys. Res. A 0168-9002 10.1016/0168-9002(87)90239-7 256, 398 (1987).
14. H. Saito and T. Hyodo, Mater. Sci. Forum 445-446, 457 (2004).
15. http://www.nmij.jp/english/service/crm/.
16. All the PMTs were from Hamamatsu Photonics K.K., Japan.