An examination of mass thickness measurements with X-ray sources

Applied Radiation and Isotopes

Volumn 66, Issue 10, 2008, Pages 1387-1391

  Mincong, Chen ^a   Hongmei, Li ^a   Ziyu, Chen ^a   Ji, Shen ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

EGSnrc; Equivalent energy; Mass attenuation; Mass thickness; Monte Carlo; X ray

Indexed keywords

ABSORPTION; ALLOYS; ALUMINA; ALUMINUM ALLOYS; ELECTRIC NETWORK ANALYSIS; LIGHT METALS; MONTE CARLO METHODS; MULTIPHOTON PROCESSES; THICKNESS MEASUREMENT; WAVE FILTERS; X RAY ANALYSIS; X RAY OPTICS; X RAY SPECTROGRAPHS;

EGSNRC; ENERGY DISTRIBUTIONS; EQUIVALENT ENERGY; LOW ENERGIES; MASS ATTENUATION; MASS THICKNESS; MONTE CARLO; MONTE CARLO SIMULATION; RELATIVE ERROR; THEORETICAL ANALYSIS; THEORETICAL MODEL; X-RAY; X-RAY ABSORPTION; X-RAY ENERGIES; X-RAY SOURCES; X-RAY SPECTRUM;

X RAYS;

ALUMINUM;

ARTICLE; ENERGY TRANSFER; MASS; MEASUREMENT; MONTE CARLO METHOD; PHOTON; PRIORITY JOURNAL; RADIATION ABSORPTION; RADIATION ATTENUATION; THEORETICAL MODEL; THICKNESS; X RAY;

ABSORPTIOMETRY, PHOTON; ALGORITHMS; ALLOYS; COMPUTER SIMULATION; MATERIALS TESTING; MODELS, STATISTICAL; MONTE CARLO METHOD;

EID: 48849101653     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2008.04.012     Document Type: Article

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