P-credence and outliers

Metron

Volumn 58, Issue 3-4, 2000, Pages 81-108

  Angers, Jean François ^a  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

Bayesian inference; Generalized exponential power family; Heavy tailed modeling; Location parameter; Outlier

Indexed keywords

EID: 48749112121     PISSN: 00261424     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

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