메뉴 건너뛰기




Volumn 59, Issue 8, 2008, Pages 886-888

Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002

Author keywords

Half Heusler phase; High resolution electron microscopy; Melt spinning; Thermoelectric material; X ray diffraction

Indexed keywords

HALF HEUSLER COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY OBSERVATION;

EID: 48749103778     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.06.039     Document Type: Article
Times cited : (7)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.