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Volumn 59, Issue 8, 2008, Pages 886-888
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Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002
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Author keywords
Half Heusler phase; High resolution electron microscopy; Melt spinning; Thermoelectric material; X ray diffraction
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Indexed keywords
HALF HEUSLER COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY OBSERVATION;
ARSENIC COMPOUNDS;
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EID: 48749103778
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2008.06.039 Document Type: Article |
Times cited : (7)
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References (11)
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