Parametric analysis of frequency domain reflectometry measurements

Canadian Conference on Electrical and Computer Engineering

Volumn , Issue , 2007, Pages 1034-1037

  Dodds, David E ^a   Fretz, Timothy ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

DSL; Reflectometry; Spectral analysis; TDR; Telephone lines

Indexed keywords

ARSENIC COMPOUNDS; CURVE FITTING; DECAY (ORGANIC); FOURIER ANALYSIS; FOURIER TRANSFORMS; LEAST SQUARES APPROXIMATIONS; LOW PASS FILTERS; MODAL ANALYSIS; PARAMETER ESTIMATION; REFLECTION; REFLECTOMETERS; TRACE ANALYSIS;

AUTOREGRESSIVE (MAR) MODELING; CONVENTIONAL APPROACH; DECAY RATES; ELECTRICAL AND COMPUTER ENGINEERING (ECE); FOURIER; FREQUENCY DOMAIN REFLECTOMETRY; LEAST SQUARES (LS); LINE FAULTS; LOW FREQUENCY (LF); MEASURING INSTRUMENTS; MODEL ORDER; MODEL PARAMETERS; PARAMETRIC ANALYSES; S INGLE FAULT; SPECTRAL LEAKAGE; SPECTRAL LINES; SPURIOUS PEAKS; TRACE DATA;

FREQUENCY DOMAIN ANALYSIS;

EID: 48749084291     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2007.264     Document Type: Conference Paper

References (3)

1. Bernardo Celaya and David E. Dodds, 2004 "Single-ended DSL Line Tester", Proceedings of IEEE Canadian Conference on Electrical and Computer Engineering, May 2-5, Niagara Falls, Canada, Vol. 4, pp. 2155-2158.
2. David E. Dodds, Muhammad Shafique and Bernardo Celaya, 2006, "TDR and FDR Identification of Bad Splices in Telephone Cables" Proceedings of IEEE Canadian Conference on Electrical and Computer Engineering, May 7-10, Ottawa, Canada, ISBN 1-4244-0038-4, pp. 1031-1034.
3. th ed., Pearson Prentice Hall, 2007, pp. 960 - 1015.