Parametrically controlled synthetic imagery experiment for face recognition testing

Proceedings of the 2003 ACM SIGMM Workshop on Biometrics Methods and Applications, WBMA 2003

Volumn , Issue , 2003, Pages 58-64

  Orlans, Nicholas M ^a   Piszcz, Alan T ^a   Chavez, Richard J ^a  

^a MITRE CORPORATION   (United States)

Author keywords

3D face modeling; Biometnc systems; Biometncs testing; Face recognition; Performance evaluation; Synthetic imagery

Indexed keywords

BIOMETRICS;

3-D FACE MODELING; BIOMETRIC SYSTEMS; FACE RECOGNITION PERFORMANCE; FACIAL RECOGNITION; PERFORMANCE EVALUATION; SHAPE AND TEXTURES; SYNTHETIC IMAGERY; SYNTHETIC IMAGES;

FACE RECOGNITION;

EID: 48649085481     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/982507.982519     Document Type: Conference Paper

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