Research on software defect prediction

Ruan Jian Xue Bao/Journal of Software

Volumn 19, Issue 7, 2008, Pages 1565-1580

  Wang, Qing ^a   Wu, Shu Jian ^a,b   Li, Ming Shu ^a  

^a INSTITUTE OF SOFTWARE   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Classification technology; Defect model; Defect prediction; Metric; Software defect

Indexed keywords

COMPUTER SOFTWARE SELECTION AND EVALUATION; DEFECTS; SOFTWARE ENGINEERING; TECHNOLOGY;

ACTIVE PARTS; CASE STUDIES; CLASSIFICATION TECHNOLOGY; DEFECT MODEL; DEFECT PREDICTION; METRIC; SOFTWARE COSTS; SOFTWARE DEFECT; SOFTWARE DEFECTS; SOFTWARE-QUALITY;

FORECASTING;

EID: 48549084964     PISSN: 10009825     EISSN: None     Source Type: Journal    
DOI: 10.3724/SP.J.1001.2008.01565     Document Type: Article

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