Material discriminated X-ray CT by using conventional microfocus X-ray tube and CdTe imager

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 1170-1174

  Onishi, Y ^a   Nakashima, T ^a   Koike, A ^a   Morii, H ^a   Neo, Y ^a   Mimura, H ^a   Aoki, T ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC PHYSICS; ATOMS; CADMIUM ALLOYS; CADMIUM COMPOUNDS; COMPUTERIZED TOMOGRAPHY; CONFORMAL MAPPING; CURVE FITTING; ELECTRIC INSTRUMENT TRANSFORMERS; ELECTRON SOURCES; ELECTRON TUBES; IMAGE SENSORS; MEDICAL IMAGING; STRONTIUM COMPOUNDS; TITANIUM; TUBES (COMPONENTS); X RAY ANALYSIS; X RAY APPARATUS; X RAY TUBES;

ATOMIC NUMBERS; ATTENUATION COEFFICIENTS; DUAL ENERGIES; EDGE DATUMS; HOMELAND SECURITIES; LEAST SQUARE ERRORS; MATERIAL DISCRIMINATIONS; PHOTON COUNTING; RECONSTRUCTED IMAGES; X-RAY CT; X-RAY METHODS;

X RAYS;

EID: 48349134965     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437215     Document Type: Conference Paper

References (2)

1. Y. Ohno, M. Torikoshi, T. Tsunoo and K. Hyodo, "Dual-energy X-ray CT with CdTe array and its extension," Nuclear Instruments and Methods in Physics Research Section A 548(2005), pp. 72-77
2. Berger, M.J., Hubbell, J.H., Seltzer, S.M., Chang, J., Coursey, J.S., Sukumar, R., and Zucker, D.S. (2005), XCOM: Photon Cross Section Database (version 1.3). [Online] Available: http://physics.nist.gov/xcom [2007, August 8]. National Institute of Standards and Technology, Gaithcrsburg, MD.