Temperature effects in reverse-type avalanche photodiodes

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 1491-1493

  Sato, Mitsuhiro ^a   Yanagida, Takayuki ^a   Yoshikawa, Akira ^a   Yatsu, Yoichi ^b   Kataoka, Jun ^b   Saito, Fumio ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE PHOTODIODES; AVALANCHES (SNOWSLIDES); HETEROJUNCTION BIPOLAR TRANSISTORS; PHOTODIODES; SNOW;

INNER STRUCTURES; IONIZATION COEFFICIENTS; MEAN FREE PATHS; TEMPERATURE DEPENDENCIES; TEMPERATURE EFFECTS;

MEDICAL IMAGING;

EID: 48349130428     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437281     Document Type: Conference Paper

References (6)

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6. Sato, M., Yanagida, T., Ito, Yatsu, Y., Yoshikawa, A., Kataoka, J.and, Fumio Saito. IEEE submitted