Application of controlled-drift detectors to spectroscopic X-ray imaging

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 1003-1008

  Castoldi, A ^b   Guazzoni, C ^a,b   Hartmann, R ^c,d   Ozkan, C ^e   Struder L ^d,f,g   Visconti, A ^d,h  

^a IEEE

^b POLITECNICO DI MILANO   (Italy)

^c PNSENSOR GMBH   (Germany)

^d MPI HALBLEITERLABOR   (Germany)

^e UNIVERSITY OF MILAN   (Italy)

^f MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^g UNIVERSITY OF SIEGEN   (Germany)

^h Dipartimento di Ingegneria Nucleare   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; DETECTORS; IMAGING TECHNIQUES; SILICON DETECTORS; X RAY ANALYSIS; X RAYS;

CONTROLLED PERTURBATIONS; DRIFT DETECTORS; DRIFT DIRECTIONS; DRIFT POTENTIALS; ELECTRON CHARGES; ELECTRON DRIFT TIMES; ENERGY RESOLUTIONS; ENERGY SPECTROSCOPIES; FLUORESCENCE IMAGING; INTEGRATION TIMES; POTENTIAL WELLS; READOUT CHANNELS; ROOM TEMPERATURES; SPECTROSCOPIC APPLICATIONS; SPECTROSCOPIC IMAGING TECHNIQUES; TIME RESOLUTIONS; WORKING PRINCIPLES; X-RAY DIFFRACTIONS;

MEDICAL IMAGING;

EID: 48349129498     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437183     Document Type: Conference Paper

References (11)

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