Optical response of nanostructured GaSb

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1382-1385

  Kildemo, M ^a   Nerbo I S ^a   Sondergard E ^b   Holt, L ^d   Simonsen, I ^b   Stchakovsky, M ^c  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SAINT GOBAIN RECHERCHE   (France)

^c Horiba Jobin Yvon   (France)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC RESPONSE; ELLIPSOMETRIC MEASUREMENTS; FAR FIELD; MEASURED DATA; MUELLER MATRIX; MUELLER MATRIX ELEMENTS; MUELLER MATRIX ELLIPSOMETRY; NANO-STRUCTURED; NANOSTRUCTURED SURFACE; OFF-SPECULAR SCATTERING; OPTICAL MEASUREMENT; OPTICAL RESPONSE; REALISABILITY; ROTATION ANGLES; SURFACE NORMALS; VISIBLE RANGE;

NANOSTRUCTURES; OPTICAL DATA PROCESSING; ROTATION; SPECTROSCOPIC ELLIPSOMETRY;

GALLIUM ALLOYS;

EID: 48349127402     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777903     Document Type: Conference Paper

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