Angular design considerations for perforated semiconductor detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 1556-1559

  Solomon, C J ^b   Shultis, J K ^b   McGregor, D S ^a,b  

^a IEEE

^b Kansas State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN CONSIDERATIONS; SEMICONDUCTOR NEUTRON DETECTORS;

ELECTRIC CONDUCTIVITY; MEDICAL IMAGING; SEMICONDUCTOR MATERIALS;

SEMICONDUCTOR DETECTORS;

EID: 48349125385     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437295     Document Type: Conference Paper

References (5)

1. D. McGregor, M. Hammig, Y. Yang, H. Gersch, and R. Klann, "Design considerations for thin film coated semiconductor thermal neutron detectors - i. basics regarding alpha particle emitting neutron reactive films," Nucl. Instr. and Meth. A, vol. 500. pp. 272-308, 2003.
2. J. Shultis and D. McGregor, "Efficiencies of coated and perforated semiconductor neutron detectors," IEEE Trans. on Nucl. Sci., vol. 53, pp. 1659-1665, 2006.
3. D. McGregor, S. Bellinger, D. Bruno, W. Dunn, W. McNeil, E. Patterson, B. Rice, J. Shultis. and T. Unruh. "Perforated diode neutron detector modules fabricated from high-purity-silicon," Radiation Physics and Chemistry, In Review, 2007.
4. J. Shultis and D. McGregor, "Calculation of ion energy-deposition spectra in silicon, lithim-flouride, boron, and boron carbide," Engineering Experiment Station Kansas State University. Tech. Rep. 299, 2004.
5. 6LiF coated and peforated detector efficiencies," Nucl. Instr. and Meth. A, no. 580, pp. 326-330, 2007.