SNR performance comparison of dual-layer detector and dual-kVp spectral CT

IEEE Nuclear Science Symposium Conference Record

Volumn 5, Issue , 2007, Pages 3820-3822

  Heismann, B J ^a   Wirth, S ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC INTENSITY; DETECTORS; ELECTRIC INSTRUMENT TRANSFORMERS; SIGNAL TO NOISE RATIO;

BASE MATERIALS; CT DATUMS; CT SYSTEMS; ENERGY WEIGHTING; LAYER DETECTORS; NOISE PROPAGATIONS; PERFORMANCE COMPARISONS; SCANNING METHODS; WEIGHTING FUNCTIONS;

MEDICAL IMAGING;

EID: 48349104955     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4436953     Document Type: Conference Paper

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