Performance characteristics of thick silicon double-sided strip detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 1656-1660

  Shokouhi, Sepideh ^a   McDonald, Benjamin S ^a   Durko, Heather L ^b   Fritz, Mark A ^a   Furenlid, Lars R ^b   Peterson, Todd E ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DETECTORS; ELECTRIC POWER SUPPLIES TO APPARATUS; SILICON DETECTORS;

HIGH POTENTIALS; HIGH RESOLUTIONS; LOW ENERGIES; PERFORMANCE CHARACTERISTICS; PHOTON INTERACTIONS; SPATIAL RESOLUTIONS; SPECT IMAGING; STRIP DETECTORS; TRIGGER THRESHOLDS;

MEDICAL IMAGING;

EID: 48349098598     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437318     Document Type: Conference Paper

References (2)

1. S. Shokouhi, H.L. Durko, M.A. Fritz, L.R. Furenlid, T.E. Peterson, "Thick Silicon Strip Detectors for Small-Animal SPECT Imaging," IEEE Nucl. Sci. Symp.Conference record, vol. 6, pp. 3562-3566, 2006
2. S. Shokouhi, M.A. Fritz, B. S. McDonald, D.W. Wilson, H. L. Durko, L. R. Furenlid, Donald W. Wilson, T.E. Peterson, "A Silicon SPECT System for Molecular Imaging of the Mouse brain," IEEE, NSS-MIC conference, 2007