Applying evolutionary yield function to predicting the deformation of microstructure-sensitive high-RRR niobium

JOM

Volumn 60, Issue 7, 2008, Pages 70-75

  Zamiri, A ^a   Jiang, H ^a   Bieler, T R ^a   Pourboghrat, F ^a  

^a Michigan State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; FAILURE ANALYSIS; FORECASTING; LITHOGRAPHY; MICROSTRUCTURE; NIOBIUM; QUALITY ASSURANCE; TEXTURES; TRANSITION METALS;

ACCELERATOR CAVITIES; COMPLEX DEFORMATION; HIGH-PURITY; R VALUES; RESIDUAL RESISTIVITY RATIO (RRR); SUPERCONDUCTING ACCELERATORS; YIELD FUNCTIONS;

RELIABILITY;

EID: 48249140259     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-008-0094-z     Document Type: Article

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