Antiferromagnetic LaFeO3 thin films and their effect on exchange bias

Journal of Physics Condensed Matter

Volumn 20, Issue 26, 2008, Pages

  Seo, J W ^a   Fullerton, E E ^b   Nolting, F ^c   Scholl, A ^d   Fompeyrine, J ^e   Locquet, J P ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; MAGNETIC MATERIALS;

AFM DOMAINS; ANTIFERROMAGNETIC (AFM); EXCHANGE BIAS (EB); FERROMAGNETIC (FM) LAYERS; INTERESTING MODEL; ORTHOFERRITES;

IMAGING TECHNIQUES;

EID: 48249117925     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/26/264014     Document Type: Article

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