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Volumn 2, Issue , 2007, Pages

Palmprint verification using complex wavelet transform

Author keywords

Biometrics; Complex wavelet; Palmprint; Similarity measurement; Transform

Indexed keywords

ACCEPTANCE RATE; ACCURATE REGISTRATION; COMPLEX WAVELET; COMPLEX WAVELET TRANSFORM; COMPLEX WAVELETS; CONTRAST CHANGES; FALSE ACCEPTANCE RATE; INTERNATIONAL CONFERENCES; MATCHING SCORE; PALMPRINT; PALMPRINT AUTHENTICATION; PALMPRINT VERIFICATION; ROUGH ALIGNMENT; SIMILARITY MEASUREMENT; STATE-OF-THE-ART METHODS; STRUCTURAL SIMILARITIES; TRANSFORM;

EID: 48149094582     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2007.4379181     Document Type: Conference Paper
Times cited : (35)

References (10)
  • 4
    • 2942549049 scopus 로고    scopus 로고
    • Characterization of palmprints by wavelet signatures via directional context modeling
    • June
    • L. Zhang and D. Zhang, 2004, "Characterization of palmprints by wavelet signatures via directional context modeling", IEEE Trans. on SMC-B, vol. 34, pp. 1335-1347, June 2004.
    • (2004) IEEE Trans. on SMC-B , vol.34 , pp. 1335-1347
    • Zhang, L.1    Zhang, D.2
  • 5
    • 0042199015 scopus 로고    scopus 로고
    • Palmprint feature extraction using 2-D Gabor filters
    • Oct
    • W.K. Kong, D. Zhang and W. Li, 2003, "Palmprint feature extraction using 2-D Gabor filters", Pattern Recognition, vol. 36, pp. 2339-2347, Oct. 2003.
    • (2003) Pattern Recognition , vol.36 , pp. 2339-2347
    • Kong, W.K.1    Zhang, D.2    Li, W.3
  • 7
    • 1942436689 scopus 로고    scopus 로고
    • Image quality assessment: From error visibility to structural similarity
    • Apr
    • Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, "Image quality assessment: From error visibility to structural similarity," IEEE Trans. Image Processing, vol. 13, pp. 600-612, Apr. 2004.
    • (2004) IEEE Trans. Image Processing , vol.13 , pp. 600-612
    • Wang, Z.1    Bovik, A.C.2    Sheikh, H.R.3    Simoncelli, E.P.4
  • 9
    • 0034291204 scopus 로고    scopus 로고
    • A parametric texture model based on joint statistics of complex wavelet coefficients
    • J. Portilla and E. P. Simoncelli, "A parametric texture model based on joint statistics of complex wavelet coefficients," Int'l J Computer Vision, vol. 40, pp. 49-71, 2000.
    • (2000) Int'l J Computer Vision , vol.40 , pp. 49-71
    • Portilla, J.1    Simoncelli, E.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.