Recovery of seismic events by time-frequency peak filtering

Proceedings - International Conference on Image Processing, ICIP

Volumn 5, Issue , 2007, Pages

  Hongbo, Lin ^a   Yue, Li ^a   Baojun, Yang ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

Common shot point; Random noise; Seismic events; Signal enhancement; Time frequency peak filtering

Indexed keywords

ADDITIVE NOISE; FREQUENCY MODULATION; IMAGE PROCESSING; RECOVERY; SEISMIC RESPONSE; SEISMIC WAVES; SEISMOLOGY; SIGNAL ENCODING; SIGNAL TO NOISE RATIO; WIGNER-VILLE DISTRIBUTION;

COMMON SHOT POINT; RANDOM NOISE; SEISMIC EVENT; SIGNAL ENHANCEMENT; TIME FREQUENCY;

INFORMATION FILTERING;

EID: 48149090571     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2007.4379860     Document Type: Conference Paper

References (7)

1. Cao Siyan and Chen Xiangpeng, "The Second-generation Waveelet Transform and its Application in Denoising of seismic Data." Applied Geophysics, vol. 2(2), pp.70-74, 2005. (in Chinese with English abstract)
2. Haris P E and R E White, "Improving the performance of f-x prediction filtering at low signal-to-noise ratio," Geophysical Prospecting, vol. 45, pp. 269-302, 1 997.
3. Wei Zhong, Baojun Yang, zhi Zhang, "Research on Application of Polynomial Fitting Technology in Highly Noisy Seismic Data," Progress in Geophysics, vol. 21(1), pp. 184-189, 2006. (in Chinese with English abstract)
4. Jones I F, Levy S., "Signal-to noise Ratio Enhancement in Multichannel Seismic Data Via The Karhunen-Loeve Transform," Geophysical Prospecting, vol. 35, pp. 12-32, 1987.
5. Boashash B., Mestefa M. "Signal Enhancement by Timefrequency Peak Filtering," IEEE Transctions on Signal Processing, vol. 52(4), pp.929-937, 2004.
6. Lei Jin, Yue Li, Baojun Yang, "Reduction of Random noise for Seismic Data by Time-frequency Peak Filtering," Progress in Geophysics, vol. 20(3), pp.724-728, 2005. (in Chinese with English abstract)
7. Boashash B., "Estimating and interpreting the instantaneous frequency of a signal-part1: Fundamentals," Proceedings of the IEEE, vol. 80(4), pp.520-538, 1992.