Development of electron energy-loss spectroscopy for nanoscience

Micron

Volumn 39, Issue 6, 2008, Pages 658-665

  Yuan, Jun ^a   Wang, Zhiwei ^a   Fu, Xin ^a   Xie, Lin ^a   Sun, Yuekui ^a   Gao, Shangpeng ^a   Jiang, Jun ^a   Hu, Xuerang ^a   Xu, Chen ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Electron energy loss spectroscopy; Electron microscopy; Nanomaterials

Indexed keywords

CHEMICAL BONDS; CHEMICAL ELEMENTS; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; STRUCTURE (COMPOSITION);

CHEMICAL BONDINGS; COMPUTING POWERS; CONVERGENCE (MATHEMATICS); ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS); LIGHT ELEMENTS; RAPID DEVELOPMENT; STRUCTURAL DETERMINATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; SPECTROSCOPY;

IMAGE ENHANCEMENT; NANOTECHNOLOGY; SPECTROSCOPY, ELECTRON ENERGY-LOSS; SPECTRUM ANALYSIS;

EID: 48049117983     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.10.010     Document Type: Article

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