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Volumn , Issue , 2007, Pages 190-196
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A proposed comprehensive architecture utilizing the Automatic Test Markup Language (IEEE 1671 and 1636.1)
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATED TEST SYSTEM;
AUTOMATIC TEST MARKUP LANGUAGE;
AUTOMATIC TEST SYSTEM;
EQUIPMENT MANUFACTURERS;
INTEGRATED DIAGNOSTICS;
LOOSE COUPLINGS;
SCHEMAS;
STRUCTURED APPROACH;
SYSTEM COMPONENTS;
TEST STATION;
AUTOMATIC TESTING;
HYPERTEXT SYSTEMS;
INFORMATION MANAGEMENT;
LINGUISTICS;
REUSABILITY;
TESTING;
XML;
MARKUP LANGUAGES;
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EID: 48049107712
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/AUTEST.2007.4374219 Document Type: Conference Paper |
Times cited : (3)
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References (10)
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